Enabling Targeted Inspection Procedures to Reduce Ultrafine Particle Emissions: Advanced Analytics Applied to the Enforcement of the APU Ban at Amsterdam Airport Schiphol

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Keywords	data analytics for enabling more targeted inspectins, APU ban at Schiphol Airport, machine learning
Thesis Advisor	van Dalen, Jan, Veelenturf, Luuk
Persistent URL	hdl.handle.net/2105/73961
Series	Business Analytics & Management
Organisation	Rotterdam School of Management
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van Beek, Hans. (2024, July 23). Enabling Targeted Inspection Procedures to Reduce Ultrafine Particle Emissions: Advanced Analytics Applied to the Enforcement of the APU Ban at Amsterdam Airport Schiphol. Business Analytics & Management. Retrieved from http://hdl.handle.net/2105/73961

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